Resources for all fields of Electromagnetic Metrology
Short-duration Training Events:
- Enrico Fermi International School of Physics, (https://www.sif.it/attivita/scuola_fermi/mmxvi#196)
Refereed Professional Journals
- IEEE Transactions on Instrumentation and Measurement, (http://ieeexplore.ieee.org)
- Metrologia, www.iopscience.org/met
- MAPAN – Journal of Metrology Society of India (https://www.springer.com/journal/12647 )